Ó²Å̹«Ë¾ÄÚ²¿Ê¹ÓõÄÓ¢ÎÄËõд
Western Digital Corporation ACRONYMS
Last Update: May 30, 2001
1394 IEEE Standard for a High Performance Serial Bus ABA Absolute Block Address MSB(CYL HI) MB(CYL LO) LSB(SEC #) ABCD Burst Servo info embedded in data tracks AC Abort Command AFT AFXMT Advanced Architecture Surface Formatter Ambient Room Air Temperature ¡À3¡ã C. API AT PCI Interface card API Application Program Interface ARCO Advanced Read Channel Optimization ASCO Advanced Servo Channel Optimization ASPT Advanced Single Plug Tester (Advanced Single Plug backend) AST Application Specific Test, embedded SW running on SDC card ATA AT Attachment Bad Block RBBlist marks a block as bad BBD Bad Block detected BPI Bits per inch BOM Bill Of Materials BUE Calibrate Table of mag field strength vs.head location across full stroke CC Cell Controller, system application used to monitor drive¡¯s test inside SPT CCC Cell Controller Configuration CCS Channel Characterization Station CEU Command Execution Unit CHS Cylinder, Head, Sector CORR Data was Corrected CIA Command Index Array CIM Computer Integrated Manufacturing, a type of data collection system Cluster Number of cylinders a head crosses before doing a head switch CPM Customer program metrics CPRT CSD Cache Segment Descriptor DAM Data Address Mark DAMNF Data Address Mark Not Found DASP Drive Active/Slave Present DCM Drive Configuration Matrix DCT Drive Configuration Table (RAM image of config sector) DFP Drive failure protection DMA Direct memory access DMS Document Management System DPPM Defective parts per million? DRDY Drive not Ready error DRM Drive Reliability Monitor DRQ IDE signal DSC Drive Seek Complete error DSFIS Drive Shop Floor Interface System DST Drive Self Test DTR Data transfer rate DUT Drive Under Test DWF Drive Write Fault DVT Drive Validation Test DX Disk Controller EAR Engineering Action Request EB Engineering Bulletin EC ECC Error Correction Code ECO Engineering Change Order EFT EIDE Enhanced Integrated Drive Interface EL Event Log EPM Engineering program management EPU Error Processing Unit ERR Error bit in status EVT Engineering Verification Testing FA FCI Flux changes per inch FCS Final Configuration Station FDP Firmware Development Process FIMMS Factory Integrated Manufacturing Management System, a type of data collection system FIN FIT Functional Integrity Test FMEA FPC Fixture Personality Card FQA Final Quality Audit FQA Final Quality Assurance FQT FROT Field Reliability Ongoing Test FSM Frame Sync Mark FTA FTC Controller Firmware Engineering Verification Test FTS Final Test Station/System FW Firmware G list Grown defect list (set to empty by FTS) GRR HALT Highly Accelerated Test HAM Host automation Module HDA Head Disk Assembly (sans PCBA) HDD Hard Disk Drive HDS High Density Servo HIB HOST SW Application used to configure and dispatch files for CC and AST use HSDT Hard Sector Descriptor Table HSSM Hard Sector State Machine HVM IBI Intelligent Burn IN IBI Logs ID Inner Diameter IDC Intelligent Drive Controller ( 1 Micro Processor Per Slot ) IDE Integrated drive Electronics IDM Intelligent defect Margining (scratch handling)
±¾ÐÂÎŹ² 3Ò³,µ±Ç°ÔÚµÚ 1Ò³ 1 2 3 |